晶圓代工服務-聯穎光電

Wavetek provides DC/RF test program development with solid experience to the customer for probe cards ordering and on-wafer testing.
Test data can be binned according to the packaging house's requirements.
Our on-wafer test solution provides customers with the complete & efficient one-stop foundry turnkey services.

Testing capabilities and services summary

DC test system

PCM Testing System
CP probing test system

CP probing test services

RF testing services

Wafer level DC and S-parameter characterization
Wafer level and board level load pull measurement
Wafer level noise pull measure ment and noise parameter extraction

DC Test System

PCM Testing System : HP4062C

System Features
- 41421B MPSMU X3
- 41420A HPSMU X1 (200V for breakdown)
- 4284 CV Meter
- 48 Pins Switch Matrix
- Tel-P8 Probe Station
Highly Accurate and Reliable Measurement Capabilities
- Van Der Pauw /Four-Point TLM Method For Resistivity Measurement
- Ferrite Bead For Device Anti-Osc
Standard Networking
- Clients /Server
- EDA system

CP probing test system

Tester : Teradyne J750EX & J750
Prober : Accretech (TSK) UF200

Low Cost, High Efficiency Parallel Test
Prober System Features
- I/O Channels: Up to 512
- Data Rate: Up to 200 MHz /400 Mbps

CP Probing Test Services

Test program development
Test program conversion
Test probecard manufacturing
Mass production test

RF testing services

Wafer level DC and S-parameter characterization
Capable for freq. from 10MHz to 110GHz
Wafer level noise pull measurement and noise parameter extraction
- Up to 65GHz small signal and 50GHz noise parameter measurement capability

Wafer level and board level load pull measurement
- Up to 4W (4GHz) / 1W (6~18GHz) power handling for one and two tone measurement
- Tuner VSWR up to 50:1

產品測試

Testing capabilities and services summary

DC test system

CP probing test services

RF testing services

DC Test System

CP Probing Test Services

RF testing services